Wavenumber formulation for V(z) curves of line-focus acoustic microscopy
Journal
Ultrasonics
Journal Volume
34
Journal Issue
2-5
Pages
327-329
Date Issued
1996
Author(s)
Abstract
A stiffness matrix formulation is proposed to incorporate electro-mechanical relations for simulating the V(z) curves of a line-focus acoustic microscope for layered media. Examples for the layer/substrate configuration of polycrystalline ZnO and silicon, which are assumed to be isotropic, are well discussed. Leaky Rayleigh, Sezawa and/or pseudo-Sezawa waves with respect to various layer thicknesses, can be easily modeled and interpreted from their V(z) curves. Results obtained from different electro-mechanical relations are also compared.
Type
journal article