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College of Science / 理學院
Applied Physics / 應用物理研究所
GENNADI BERSUKER, BRENDAN FORAN, AND PAT LYSAGHT
Details
GENNADI BERSUKER, BRENDAN FORAN, AND PAT LYSAGHT
Journal
Defects in HIgh-k Gate Dielectric Stacks: Nano-Electronic Semiconductor Devices
Journal Volume
220
Pages
349
Date Issued
2006
Author(s)
MINGHWEI HONG
KWO, J RAYNIEN
URI
http://scholars.lib.ntu.edu.tw/handle/123456789/323219
Type
journal article