Reliability Assessment of Electronic Devices Based on a High-Degree-of-Freedom Acceleration Model
Date Issued
2011
Date
2011
Author(s)
Kang, Hsiang-Min
Abstract
In order to understand the reliability characteristics of electronic device, such as electronic connector, researchers often use accelerated life test to obtain the life of products, and then analyze and assess the reliability of products. In this study, to understand the reliability properties of 2-mm Hard Metric Connector, the accelerate life tests with multiple stress factors were conducted for different types of plating thickness of connector pins. After the test, life of connector pins in accelerated life test is analyzed with regression analysis, and the results are used to extrapolate the life in normal environment by acceleration model. Finally, the reliability index of connector pins with reliability theory is evaluated. Unlike many accelerated tests that only cover the impact of products by two acceleration factors, three and more types of acceleration factor are included in this study. For this reason, the common acceleration model is transformed to Generalized Log-Linear (GLL) model with high degree of freedom which this study is based. According to the analysis results, it is found that these types of connector pins have a high durability for plugging and unplugging, but cannot endure the impact of high temperature. The prediction for connector pins life in normal operated condition with temperature of 45 ℃, durability cycles of 50, and MFG rate of 0.5, the life of 50 μ'' plating thickness is 595,760 hours, the 40 μ'' plating thickness is 600,584 hours, the 30 μ'' plating thickness is 490,151 hours, and the life of 20 μ'' plating thickness is 415,537 hours. As a result, no matter what the plating thickness of connector pins is, all of them have very high reliability in this study.
Subjects
connector pins
reliability
accelerated test
acceleration model
multiple stress
regression analysis
Type
thesis
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