Double-layer amorphous InGaZnO thin film transistors with high mobility and high reliability

Journal

VLSI-TSA 2021 - 2021 International Symposium on VLSI Technology, Systems and Applications, Proceedings

Date Issued

2021

Author(s)

Li S.-L

Lee M.-X

Yen C.-C

Chen T.-L

Chou C.-H

DOI

URI

Type

conference paper