Leakage in coplanar waveguides with finite metallization thickness and conductivity
Resource
Microwave Symposium Digest, 1995., IEEE MTT-S International
Journal
Microwave Symposium Digest, 1995., IEEE MTT-S International
Pages
-
Date Issued
1995-05
Date
1995-05
Author(s)
Ke, Jeng-Yi
Chen, Chun Hsiung
DOI
N/A
Abstract
The interesting phenomenon of leakage in a practical coplanar waveguide structure with finite metallization thickness and conductivity is investigated. By applying the modified spectral-domain approach, its attenuation constants due to both leakage and conductor loss are compared and discussed. In particular, the effective dielectric constant and attenuation constant are carefully studied, together with the current distributions within the metallic signal strip and ground planes.>
Type
journal article
File(s)![Thumbnail Image]()
Loading...
Name
00405912.pdf
Size
251.86 KB
Format
Adobe PDF
Checksum
(MD5):6d21f52d88af63c4e14bcc9c67c7427d