Applications of damage models to durability investigations for electronic connectors

Resource

Materials & Design 30 (1): 194-199

Journal

Materials and Design

Journal Volume

30

Journal Issue

1

Pages

194-199

Date Issued

2009

Author(s)

Chang, C.-C.

DOI

URI

SDGs

[SDGs]SDG12

Type

journal article

File(s)

Name

05.pdf

Size

23.95 KB

Format

Adobe PDF

Checksum

(MD5):a44c094a0fe48a95867864683c0e795c