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College of Electrical Engineering and Computer Science / 電機資訊學院
Electrical Engineering / 電機工程學系
Investigation of Substrate Noise Isolation Solutions in Deep Submicron CMOS Technology
Details
Investigation of Substrate Noise Isolation Solutions in Deep Submicron CMOS Technology
Journal
Canadian Conference on Electrical and Computer Engineering
Pages
1106-1109
Date Issued
2007-04
Author(s)
H. Lin
J. Kuo
r. Sobot
M. Syrzycki
JAMES-B KUO
DOI
10.1109/CCECE.2007.282
URI
http://scholars.lib.ntu.edu.tw/handle/123456789/333619
Type
conference paper
