An Automated W-Band On-Wafer Noise Figure Measurement System

Journal

41st ARFTG Conference Digest - Spring 1993

Pages

48-56

Date Issued

1993

Author(s)

Chen, S.

Yang, D.C.

Wang, H.

Hayashibara, K.

Godshalk, E.M.

Allen, B.

DOI

10.1109/ARFTG.1993.327019

URI

https://scholars.lib.ntu.edu.tw/handle/123456789/497419

URL

https://www.scopus.com/inward/record.uri?eid=2-s2.0-33746227059&doi=10.1109%2fARFTG.1993.327019&partnerID=40&md5=cd4617ee616f55100e3158d69efcbac7

Type

conference paper