Real-time equipment health evaluation and dynamic preventive maintenance
Resource
Semiconductor Manufacturing, 2000. Proceedings of ISSM 2000. The Ninth International Symposium on
Journal
The Ninth International Symposium on Semiconductor Manufacturing, 2000
Pages
-
Date Issued
2000-09
Date
2000-09
Author(s)
DOI
N/A
Abstract
With the great advancement of sensor and information technology, the semiconductor equipment data is now available to process engineers in real time. However the volume of data collected and quickly accumulated is often so large that the data is rarely analyzed and put to use effectively. In this paper, we propose an integrated approach that utilizes multivariate statistical techniques to combine various equipment data items into a single equipment health index. We then use this index to determine appropriate time points for equipment preventive maintenance (PM).
Type
journal article
File(s)![Thumbnail Image]()
Loading...
Name
00993691.pdf
Size
507.51 KB
Format
Adobe PDF
Checksum
(MD5):cb8d772f02044f04a1148bb3fa5c92cd