A new approach to the microstrip lines with finite strip thickness and conductivity
Resource
Microwave Symposium Digest, 1993., IEEE MTT-S International
Journal
Microwave Symposium Digest, 1993., IEEE MTT-S International
Pages
-
Date Issued
1993-06
Date
1993-06
Author(s)
Ke, Jeng-Yi
Chen, Chun Hsiung
DOI
N/A
Abstract
A method is proposed to deal with the microstrip line with layer structure in which the thickness and conductivity of the signal strip are finite. The phase constant beta and attenuation constant alpha of the microstrip line with finite strip thickness and finite conductivity are examined together with the current distributions along the signal strip. The advantage of the CPU time is reflected in the fact that the approach requires 30 s to calculate the phase and attenuation constants per frequency point using the Sun SparcStation 2. The proposed method can be applied to structures with superconductor signal strip and/or semiconductor substrates.>
Type
journal article
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