Modeling and simulation of negative capacitance gate on Ge FETs

Journal

ECS Transactions

Journal Volume

75

Journal Issue

8

Pages

461-467

Date Issued

2016

Author(s)

Liao, Y.-H.

Fan, S.-T.

DOI

10.1149/07508.0461ecst

URI

https://scholars.lib.ntu.edu.tw/handle/123456789/502131

URL

https://www.scopus.com/inward/record.uri?eid=2-s2.0-84991670425&doi=10.1149%2f07508.0461ecst&partnerID=40&md5=a2379bd05c6f69bd7d26c19b9a2ef970

Type

conference paper