The X-Ray Topographical Analysis of Defects in the Epitaxture CdTe/GaAs
Resource
Chinese Journal of Materials Science, v.19, p.294
Journal
Chinese Journal of Materials Science
Journal Volume
v.19
Pages
29-4
Date Issued
1987
Date
1987
Author(s)
Yang, Seng-Jenn
Hsu, Shu-En
Type
journal article