Analysis of Valence Shell Electronic Excitations in Si and Its Refractory Compounds Using Electron Energy Loss Microspectroscopy

Resource

Journal of Applied Physics, v.64, p.6328

Journal

Journal of Applied Physics

Journal Volume

v.64

Pages

632-8

Date Issued

1988

Date

1988

Author(s)

Lin, Sheng-Hsien

URI

Type

journal article