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College of Science / 理學院
Applied Physics / 應用物理研究所
Flicker noise characteristics in GaAs MOSFETs
Details
Flicker noise characteristics in GaAs MOSFETs
Journal
MBE conference 2006
Date Issued
2006
Author(s)
Chan, CY
Tsai, PJ
Lee, TC
Hsu, Shawn SH
Kwo, J
MINGHWEI HONG
URI
http://scholars.lib.ntu.edu.tw/handle/123456789/323236
Description
Tokyo
Type
journal article
