Robust output high-gain feedback controllers for the atomic force microscope under high data sampling rate

Resource

Control Applications, 1999. Proceedings of the 1999 IEEE International Conference on

Journal

1999 IEEE International Conference on Control Applications

Pages

-

Date Issued

1999-08

Date

1999-08

Author(s)

Hsu, Su-Hau

DOI

DOI

N/A

URI

Type

journal article

File(s)

Name

00801215.pdf

Size

311.36 KB

Format

Adobe PDF

Checksum

(MD5):20e99e6477c3d16e815bf90d5e0a1e78