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College of Electrical Engineering and Computer Science / 電機資訊學院
Electronics Engineering / 電子工程學研究所
On guaranteeing capture safety in at-speed scan testing with broadcast-scan-based test compression
Details
On guaranteeing capture safety in at-speed scan testing with broadcast-scan-based test compression
Journal
International Conference on VLSI Design
Pages
279-284
Date Issued
2013-01
Author(s)
K. Enokimoto
X. Wen
K. Miyase
J.-L. Huang
S. Kajihara
L.-T. Wang
JIUN-LANG HUANG
DOI
10.1109/VLSID.2013.201
URI
http://scholars.lib.ntu.edu.tw/handle/123456789/381692
Type
conference paper
