Role of lateral diffusion current in perimeter-dependent current of MOS(p) tunneling temperature sensors

Journal

IEEE Transactions on Electron Devices

Journal Volume

61

Journal Issue

10

Pages

3562-3565

Date Issued

2014

Author(s)

Lin, Y.-K.

Hwu, J.-G.

DOI

10.1109/TED.2014.2346238

URI

http://www.scopus.com/inward/record.url?eid=2-s2.0-84907474205&partnerID=MN8TOARS

http://scholars.lib.ntu.edu.tw/handle/123456789/385258

Type

journal article