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College of Electrical Engineering and Computer Science / 電機資訊學院
Electrical Engineering / 電機工程學系
Static property checking using ATPG vs. BDD techniques.
Details
Static property checking using ATPG vs. BDD techniques.
Journal
Proceedings IEEE International Test Conference 2000, Atlantic City, NJ, USA, October 2000
Pages
309-316
Date Issued
2000
Author(s)
Huang, Chung-Yang
Yang, Bwolen
Tsai, Huan-Chih
Cheng, Kwang-Ting
CHUNG-YANG HUANG
DOI
10.1109/TEST.2000.894219
URI
https://scholars.lib.ntu.edu.tw/handle/123456789/499724
URL
https://doi.org/10.1109/TEST.2000.894219
Type
conference paper
