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College of Electrical Engineering and Computer Science / 電機資訊學院
Electronics Engineering / 電子工程學研究所
Diagnosis of Scan Chains with Multiple Timing Faults Using Single Excitation Patterns
Details
Diagnosis of Scan Chains with Multiple Timing Faults Using Single Excitation Patterns
Journal
VLSI/CAD Symposium
Pages
94
Date Issued
2004-01
Author(s)
CHIEN-MO LI
C. K. Yo
CHIEN-MO LI
URI
http://scholars.lib.ntu.edu.tw/handle/123456789/310818
Type
conference paper