Dynamic bias temperature instability of p-channel polycrystalline silicon thin-film transistors

Journal

International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA

Pages

158-162

Date Issued

2009

Author(s)

Huang, C.-F.

Sun, H.-C.

Kuo, P.-S.

Chen, Y.-T.

Liu, C.W.

Hsu, Y.-J.

Chen, J.-S.

DOI

URI

Type

conference paper