The demonstration of colossal magneto-capacitance and “negative” capacitance effect with the promising characteristics of Jg-EOT and transistor’s performance on Ge (100) n-FETs by the novel magnetic gate stack scheme design
Journal
2014 Symposium on VLSI Technology (VLSI-technology)
Date Issued
2014
Author(s)
Description
美國夏威夷
Type
conference paper
