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College of Electrical Engineering and Computer Science / 電機資訊學院
Electrical Engineering / 電機工程學系
Feasibility Study of Scanning Photocurrent Microscopy in Ultra-Thin Silicon Nanowire Ohmic-Contact Devices
Details
Feasibility Study of Scanning Photocurrent Microscopy in Ultra-Thin Silicon Nanowire Ohmic-Contact Devices
Journal
MOC 2019 - 24th Microoptics Conference
Pages
270-271
Date Issued
2019
Author(s)
Chu, C.-H.
MING-HUA MAO
DOI
10.23919/MOC46630.2019.8982753
URI
https://www.scopus.com/inward/record.url?eid=2-s2.0-85081098029&partnerID=40&md5=971dfb38ad13fbbae19100f2294fd91d
https://scholars.lib.ntu.edu.tw/handle/123456789/559115
Type
conference paper
