Study of current leakage in InAs p-i-n photodetectors
Journal
Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
Journal Volume
18
Journal Issue
6
Pages
2624-2626
Date Issued
2000
Author(s)
CHIEH-HSIUNG KUAN
Lin, R.-M.
Tang, S.-F.
CHIEH-HSIUNG KUAN
Type
journal article