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College of Electrical Engineering and Computer Science / 電機資訊學院
Computer Science and Information Engineering / 資訊工程學系
Guest Editors' Introduction: Critical and Enabling Techniques for Emerging Memories
Details
Guest Editors' Introduction: Critical and Enabling Techniques for Emerging Memories
Journal
Ieee Design & Test
Journal Volume
34
Journal Issue
3
Pages
6-7
Date Issued
2017
Author(s)
Chen, Yiran
de Salvo, Barbara
TEI-WEI KUO
DOI
10.1109/MDAT.2017.2682253
URI
https://scholars.lib.ntu.edu.tw/handle/123456789/489908
Type
journal article
