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College of Electrical Engineering and Computer Science / 電機資訊學院
Photonics and Optoelectronics / 光電工程學研究所
Measurement mechanism of the electrical properties of extremely high-conductivity layered p-type structures
Details
Measurement mechanism of the electrical properties of extremely high-conductivity layered p-type structures
Journal
Photonics West 2018
Pages
319
Date Issued
2018
Author(s)
Hao-Tsung Chen
Yang Kuo
Yu-Feng Yao
Yean-Woei Kiang
C. C. Yang
CHIH-CHUNG YANG
URI
https://scholars.lib.ntu.edu.tw/handle/123456789/429735
Type
conference paper
