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College of Engineering / 工學院
Materials Science and Engineering / 材料科學與工程學系
Determination of thickness and lattice distortion for the individual layer of strained AlGaN/GaN superlattice by high-angle annular dark-field scanning transmission electron microscopy
Details
Determination of thickness and lattice distortion for the individual layer of strained AlGaN/GaN superlattice by high-angle annular dark-field scanning transmission electron microscopy
Resource
Applied Physics Letters 87: 031914-031916
Journal
Applied
Pages
Physic-s
Date Issued
2005
Date
2005
Author(s)
Shiojiri, M.
Ceh, M.
Sturm, S.
Chuo, C.C.
Hsu, J. T.
Yang, J. R.
Sajio, H.
URI
http://ntur.lib.ntu.edu.tw//handle/246246/93265
Type
journal article
File(s)
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Name
26.pdf
Size
237.64 KB
Format
Adobe PDF
Checksum
(MD5):02da4152398866a3764120bc92a0d59d
