Analysis of eddy currents in a bar containing an embedded defect

Resource

NDT & E International 32 (5): 293-303

Journal

NDT & E International

Journal Volume

32

Journal Issue

5

Pages

293-303

Date Issued

1999

Date

1999

Author(s)

Liaw, J. W.

Chu, S. L.

Yeh, C. S.

Kuo, M. K.

URI

http://ntur.lib.ntu.edu.tw//handle/246246/106741

File(s)

Name

07.pdf

Size

404.89 KB

Format

Adobe PDF

Checksum

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