Skip to main content
English
中文
Log In
Log in
Log in with ORCID
NTU Single Sign On
New user? Click here to register.
Have you forgotten your password?
Home
College of Engineering / 工學院
Mechanical Engineering / 機械工程學系
Rotational Positioning System Adapted to Atomic Force Microscope for Measuring Anisotropic Surface Properties
Details
Rotational Positioning System Adapted to Atomic Force Microscope for Measuring Anisotropic Surface Properties
Journal
REVIEW OF SCIENTIFIC INSTRUMENTS
Journal Volume
82
Pages
113710
Date Issued
2011
Author(s)
H.-S. Liao
B.-J. Juang
W.-C. Chang
W.-C. Lai
K.-Y. Huang
C.-S. Chang
HSIEN-SHUN LIAO
URI
https://scholars.lib.ntu.edu.tw/handle/123456789/589480
Type
journal article
