Rotational Positioning System Adapted to Atomic Force Microscope for Measuring Anisotropic Surface Properties

Journal

REVIEW OF SCIENTIFIC INSTRUMENTS

Journal Volume

82

Pages

113710

Date Issued

2011

Author(s)

H.-S. Liao

B.-J. Juang

W.-C. Chang

W.-C. Lai

K.-Y. Huang

C.-S. Chang

HSIEN-SHUN LIAO

DOI

10.1063/1.3664617

URI

https://scholars.lib.ntu.edu.tw/handle/123456789/589480

https://www.scopus.com/inward/record.uri?eid=2-s2.0-82555173680&doi=10.1063%2f1.3664617&partnerID=40&md5=5ebdd5e2915f673e730cd7e1da693285

Type

journal article