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College of Engineering / 工學院
Industrial Engineering / 工業工程學研究所
Statistical multi-objective optimization and its application to IC layout design for E-tests
Details
Statistical multi-objective optimization and its application to IC layout design for E-tests
Journal
IEEE International Symposium on Semiconductor Manufacturing Conference Proceedings
Pages
138-141
Date Issued
2007
Author(s)
Chen, A.
Chen, V.
Hsu, C.
ARGON CHEN
DOI
10.1109/ISSM.2007.4446789
URI
https://scholars.lib.ntu.edu.tw/handle/123456789/467248
URL
https://www.scopus.com/inward/record.uri?eid=2-s2.0-50249172222&doi=10.1109%2fISSM.2007.4446789&partnerID=40&md5=a9a9d787532fdcd339996e0b6cc0a5bf
Type
conference paper
