Multilevel Full-Chip Routing With Testability and Yield Enhancement

Resource

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 26 (9): 1625-1636

Journal

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Journal Volume

26

Journal Issue

9

Pages

1625-1636

Date Issued

2007

Date

2007

Author(s)

Li, Katherine Shu-Min

Lee, Chung-Len

Su, Chauchin

Chen, Jwu E.

URI

Type

journal article

File(s)

Name

36.pdf

Size

652.95 KB

Format

Adobe PDF

Checksum

(MD5):8cd76680a3e291ecfc537b1ce03fdade