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College of Electrical Engineering and Computer Science / 電機資訊學院
Electronics Engineering / 電子工程學研究所
Test Pattern Modification for Average IR-drop Reduction
Details
Test Pattern Modification for Average IR-drop Reduction
Journal
IEEE Int’l Test Conf.
Date Issued
2013-01
Author(s)
CHIEN-MO LI
WS Ding
HY Hsieh
CHIEN-MO LI
URI
http://scholars.lib.ntu.edu.tw/handle/123456789/381713
Type
conference paper