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College of Electrical Engineering and Computer Science / 電機資訊學院
Electrical Engineering / 電機工程學系
An Efficient Testing Method for Quantum Boolean Circuits
Details
An Efficient Testing Method for Quantum Boolean Circuits
Journal
2004 ERATO conference on Quantum Information Science(EQIS'04)
Date Issued
2004-09
Author(s)
C. Y. Lu
S. A. Wang
I. M. Tsai
SY-YEN KUO
URI
http://scholars.lib.ntu.edu.tw/handle/123456789/310563
Type
conference paper