Design and Chip Implementation of the Segment Weighted Random BIST for Low Power Testing

Resource

Journal of Low Power Electronics 3 (2): 206-216

Journal

Journal of Low Power Electronics

Journal Volume

3

Journal Issue

2

Pages

206-216

Date Issued

2007

Date

2007

Author(s)

Lee, Chun-Yi

Li, James Chien-Mo

URI

Type

journal article