A Study on Adopting RFID Technology to Model a Real-time Information Sharing System for Wafer Testing Center－The Case Study of C Wafer Testing Company
Date Issued
2006
Date
2006
Author(s)
Gao, Fendy
DOI
zh-TW
Abstract
Responding to the trends of fast change of semiconductor technique, high competition and promoting customer's satisfaction have already become the most important topics to semiconductor industry. In addition to manufacturing capability, providing customer's information and the speed of manufacture to deliver goods will be the keys of victory. Therefore, this research aims at a wafer test factory. By implementing RFID(Radio Frequency Identification) technique to construct a real-time manufacturing supervision system and real-time common information sharing system across value chains, it will shorten manufacturing cycle time and customer response time to achieve the management goals of zero time lag, zero time delay, zero machine waiting time and zero inventory.
The RFID technique had the following characteristics like recognition & collection of wireless data and reading many items in the meantime. To be different from bar code operation mode which reads product information passively, it will actively deliver itself information. We expect to reduce operation failures and increase operation efficiency significantly. RFID is thought to be an important technique which influences the global industry in the near future. For the requests of high precision, high complication, high production and long manufacturing cycle for semiconductor industry, RFID system fits for management requirement. Currently there are more than 30 wafer manufactories who implemented RFID projects; However there is no such RFID project rolled out at wafer test and assembly factories. This research makes use of RFID’s characteristic and function in following areas like logistics, improving process efficiency and reducing human errors by Auto WIP, Auto Setup and E-run card.
This research will use one domestic wafer test factory as a case study. Through interviewing the project manager and experienced engineers many times, they share how this project adopts RFID technique to identify and resolve the blind spot of production process inside the present factory; By interviewee’s experience and analysis of the related documents, this research will leverage the current RFID prototype system which includes instant information sharing system and infrastructure to evaluate the benefits of RFID technique. In addition to evaluating benefits, we will analyze the testing result and identify the obstacles of performance. We will put forward conclusion and suggestion for other semi-conductors who will implement RFID projects in the future.
Subjects
RFID
晶圓測試廠
RFID (Radio Frequency Identification)
Wafer testing factory
Real-time system
Type
other
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