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College of Electrical Engineering and Computer Science / 電機資訊學院
Electronics Engineering / 電子工程學研究所
DR Scan: DR-scan: A Test Methodology for Dual-rail Asynchronous Circuit
Details
DR Scan: DR-scan: A Test Methodology for Dual-rail Asynchronous Circuit
Journal
Design Automation Conference
Date Issued
2015-01
Author(s)
Shih-An. Hsieh
Y.-H.Wang
K.Y. Huang
CHIEN-MO LI
URI
http://scholars.lib.ntu.edu.tw/handle/123456789/394740
Type
conference paper