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College of Electrical Engineering and Computer Science / 電機資訊學院
Electrical Engineering / 電機工程學系
Studying time-dependent contribution of hot-electron versus lattice-induced thermal-expansion response in ultra-Thin Au-nanofilms
Details
Studying time-dependent contribution of hot-electron versus lattice-induced thermal-expansion response in ultra-Thin Au-nanofilms
Journal
Applied Physics Letters
Journal Volume
117
Journal Issue
15
Date Issued
2020
Author(s)
Wang, P.-J.
Shen, C.-C.
Chou, K.-Y.
Ho, M.-H.
Sheu, J.-K.
CHI-KUANG SUN
DOI
10.1063/5.0023700
URI
https://www.scopus.com/inward/record.url?eid=2-s2.0-85092609168&partnerID=40&md5=2e22fc0860a0f8ca05e15245c592f05d
https://scholars.lib.ntu.edu.tw/handle/123456789/550682
Type
journal article
