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College of Electrical Engineering and Computer Science / 電機資訊學院
Electronics Engineering / 電子工程學研究所
Back-End-of-Line Defect Analysis for Rnv8T Nonvolatile SRAM
Details
Back-End-of-Line Defect Analysis for Rnv8T Nonvolatile SRAM
Journal
IEEE Asian Test Symposium
Date Issued
2013-01
Author(s)
CHIEN-MO LI
BC Bai
C-L Hsu
MH Wu
CA Chen
YW Chen
KL Luo
LC Cheng
CHIEN-MO LI
DOI
10.1109/ATS.2013.32
URI
http://scholars.lib.ntu.edu.tw/handle/123456789/381717
Type
conference paper