Experimental determination of minority electron mobility in p-type pseudomorphic SiGe/Si

Journal

Topical Meeting on Silicon Mono-lithic Integrated Circuits in RF Systems

Pages

10-15

Date Issued

1998-09

Author(s)

J.-S. Rieh

L.-H. Lu

L. P. B. Katehi

P. Bhattacharya

DOI

URI

Type

conference paper