Variable Pre-Charge Compensation With Scalable Double Pulse Test System for Improved Switching Loss Extraction
Journal
IEEE Journal of Emerging and Selected Topics in Industrial Electronics
Start Page
1
End Page
10
ISSN
2687-9735
2687-9743
Date Issued
2025-10-28
Author(s)
Abstract
This paper presents a novel variable pre-charge compensation (VPC) technique integrated with a scalable double pulse test (DPT) system to enhance the accuracy of switching loss measurements. The conventional DPT setup could underestimate switching losses due to voltage drops and non-ideal components in the test circuit. To address this issue, the proposed VPC method compensates for these inaccuracies by pre-charging the bulk capacitor, ensuring accurate voltage and current conditions during switching events. Additionally, a modular DC power supply design with a simple communication mechanism is introduced, providing the flexibility needed for various test conditions. Prototypes of both the DPT platform and modular power supply were developed and tested. Experimental results demonstrate that the proposed VPC technique effectively eliminates measurement inaccuracy, achieving up to a 55.1% correction in switching loss compared to conventional DPT methods.
Subjects
Double Pulse Test (DPT)
modular power supply
power semiconductor devices
switching loss
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Type
journal article