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College of Electrical Engineering and Computer Science / 電機資訊學院
Electronics Engineering / 電子工程學研究所
Pseudo Random Testing Theoretical Models vs. Real Data
Details
Pseudo Random Testing Theoretical Models vs. Real Data
Journal
IEEE International Workshop on Test Resource Partitioning
Date Issued
2001-01
Author(s)
CHIEN-MO LI
Mitra
S.
C.W. Tseng
J. C. M Li
E. J. McCluskey
CHIEN-MO LI
URI
http://scholars.lib.ntu.edu.tw/handle/123456789/294587
Type
conference paper