Mechanically strained Si/SiGe HBTs

Resource

IEEE Electron Device Letters 25 (7): 483-485

Journal

IEEE Electron Device Letters

Journal Volume

25

Journal Issue

7

Pages

483-485

Date Issued

2004

Date

2004

Author(s)

Yuan, F.

Jan, S.-R.

Maikap, S.

Liu, Y.-H.

Liang, C.-S.

Liu, C.W.

URI

Type

journal article

File(s)

Name

40.pdf

Size

132.83 KB

Format

Adobe PDF

Checksum

(MD5):85a99765a914def75cd0d5dcc17ea58f