Test Response Compaction and Diagnosis using BCH code
Date Issued
2008
Date
2008
Author(s)
Wang, Fang-Min
Abstract
This thesis presents a test response compaction and diagnosis technique based on BCH error correction code. Traditional time domain BCH compaction is not very useful in practice because the area overhead is too large. On the other hand, space domain BCH compaction does not have sufficient compression ratio to support multiple error diagnosis. This technique shares the polynomials among scan chains to reduce the area overhead. A Boolean satisfiability optimizer is employed to diagnose the failing flop-flops. In addition, a mathematical model is proposed to analytically estimate the aliasing probability and to aid the design of compaction circuitry. Simulation results show that, for designs of 500K flip-flops, our compression ratio is more than 2,600, which is much higher than that of space domain compaction. The area overhead is less than 60% of that of time domain BCH compaction.
Subjects
Test Response
Compaction
Diagnosis
BCH code
Type
thesis
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