Diagnosis of Multiple Scan Chain Timing Faults

Resource

IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS 27 (6): 1104-1116

Journal

IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS

Journal Volume

27

Journal Issue

6

Pages

1104-1116

Date Issued

2008

Date

2008

Author(s)

Chuang, Wei-Shun

Lin, Shiu-Ting

Liu, Wei-Chih

James Li, Chien-Mo

URI

Type

journal article

File(s)

Name

10.pdf

Size

1.09 MB

Format

Adobe PDF

Checksum

(MD5):684e9e8b75fc92a10b76b3f17492678f