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Comprehensive study on dynamic bias temperature instability of p-channel polycrystalline silicon thin-film transistors
Journal
2007 International Semiconductor Device Research Symposium
Date Issued
2007
Author(s)
Huang, C.-F.
Yang, Y.-J.
Peng, C.-Y.
Sun, H.-C.
Liu, C.W.
Chao, C.-W.
Lin, K.-C.
Type
conference paper