Measurements of residual stresses in Al film/silicon nitride substrate microcantilever beam systems
Resource
Journal of Materials Research, 26(10), 1279-1284
Journal
Journal of Materials Research
Pages
1279-1284
Date Issued
2011
Date
2011
Author(s)
Type
journal article
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193.pdf
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23.49 KB
Format
Adobe PDF
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(MD5):3162b8d55d2f9867ca2b80a59054c31b
