Investigation of reliability characteristics in NMOS and PMOS FinFETs

Journal

IEEE Electron Device Letters

Journal Volume

29

Journal Issue

7

Pages

788-790

Date Issued

2008

Author(s)

Liao, W.-S.

Liaw, Y.-G.

Tang, M.-C.

Chakraborty, S.

DOI

10.1109/LED.2008.2000723

URI

http://www.scopus.com/inward/record.url?eid=2-s2.0-47249154866&partnerID=MN8TOARS

http://scholars.lib.ntu.edu.tw/handle/123456789/341153

Type

journal article