Ensemble Dependent Matrix Methodology for Probabilistic-Based Fault-tolerant Nanoscale Circuit Design.

Journal

International Symposium on Circuits and Systems (ISCAS 2007), 27-20 May 2007, New Orleans, Louisiana, USA

Pages

1803-1806

Date Issued

2007

Author(s)

Rao, Huifei

Chen, Jie

Yu, Changhong

Ang, Woon Tiong

Wey, I-Chyn

Wu, An-Yeu

Zhao, Hong

DOI

URI

URL

Type

conference paper