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  4. Atomic-scale epitaxial aluminum film on GaAs substrate
 
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Atomic-scale epitaxial aluminum film on GaAs substrate

Journal
AIP Advances
Journal Volume
7
Journal Issue
7
Date Issued
2017
Author(s)
Fan, Y.-T.
Lo, M.-C.
Wu, C.-C.
Chen, P.-Y.
Wu, J.-S.
CHI-TE LIANG  
Lin, S.-D.
DOI
10.1063/1.4991435
URI
https://scholars.lib.ntu.edu.tw/handle/123456789/436722
URL
https://www.scopus.com/inward/record.uri?eid=2-s2.0-85025842024&doi=10.1063%2f1.4991435&partnerID=40&md5=c170aa6888fd9d1d1ba9c970f91246ab
Abstract
Atomic-scale metal films exhibit intriguing size-dependent film stability, electrical conductivity, superconductivity, and chemical reactivity. With advancing methods for preparing ultra-thin and atomically smooth metal films, clear evidences of the quantum size effect have been experimentally collected in the past two decades. However, with the problems of small-area fabrication, film oxidation in air, and highly-sensitive interfaces between the metal, substrate, and capping layer, the uses of the quantized metallic films for further ex-situ investigations and applications have been seriously limited. To this end, we develop a large-area fabrication method for continuous atomic-scale aluminum film. The self-limited oxidation of aluminum protects and quantizes the metallic film and enables ex-situ characterizations and device processing in air. Structure analysis and electrical measurements on the prepared films imply the quantum size effect in the atomic-scale aluminum film. Our work opens the way for further physics studies and device applications using the quantized electronic states in metals.
Type
journal article

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