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College of Electrical Engineering and Computer Science / 電機資訊學院
Electrical Engineering / 電機工程學系
A Study of the Leakage Property of Thin Gate Oxides
Details
A Study of the Leakage Property of Thin Gate Oxides
Date Issued
1990
Date
1990
Author(s)
Hwu, Jenn-Gwo
URI
http://ntur.lib.ntu.edu.tw//handle/246246/153879
Type
report