A DfT Technique for Diagnosing Integrator Leakage of Single-Bit First-Order Delta-Sigma Modulator Using DC Input
Resource
International Journal of Electrical Engineering, 16(5), 411-420
Journal
International Journal of Electrical Engineering
Journal Volume
16
Journal Issue
5
Pages
411-420
Date Issued
2009
Date
2009
Author(s)
Huang, X.-L.
Yang, C.-Y.
Huang, J.-L.
Type
journal article